MS 6220-0

Brief

The purpose of this course is designed to familiarize the student with the operation of EPMA, SEM-EDX, Soft X-Ray and EBSD. Focuses are directed to study the effects of instrument operational parameters on X-ray microanalysis, in addition to the strategy and skillful technique for SEM and FESEM image. Related techniques, including EDX, WDX, SXES and EBSD, will be addressed. Another aim is to familiarize the student with the principle and application of electron microanalysis via X-ray technique. Special efforts will be focused on the newly developed field emission electron probe micro analyzer, liquid nitrogen-free EDX ,SXES, and novel design for EBSD technique.

Description

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Timetable

Scores

Average GPA 3.54

Std. Deviation 0.59

Remarks

Restrictions

Compulsory

Elective

Cross Discipline

First Specialization

Second Specialization